On partial tests and partial reducts for decision tables

Mikhail Ju Moshkov; Marcin Piliszczuk

On partial tests and partial reducts for decision tables

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In the paper a greedy algorithm for construction of partial tests is considered. Bounds on minimal cardinality of partial reducts are obtained. Results of experiments with software implementation of the greedy algorithm are described.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Pages	149-155
Number of pages	7
State	Published - 2006
Externally published	Yes
Event	High-Power Diode Laser Technology and Applications IV - San Jose, CA, United States Duration: Jan 23 2006 → Jan 25 2006

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	6104
ISSN (Print)	0277-786X

Other

Other	High-Power Diode Laser Technology and Applications IV
Country/Territory	United States
City	San Jose, CA
Period	01/23/06 → 01/25/06

Keywords

Greedy algorithm
Partial cover
Partial reduct
Partial test

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Applied Mathematics
Electrical and Electronic Engineering
Computer Science Applications

Cite this

@inproceedings{ea41840e8568444c8d649658cd4e2ab6,

title = "On partial tests and partial reducts for decision tables",

abstract = "In the paper a greedy algorithm for construction of partial tests is considered. Bounds on minimal cardinality of partial reducts are obtained. Results of experiments with software implementation of the greedy algorithm are described.",

keywords = "Greedy algorithm, Partial cover, Partial reduct, Partial test",

author = "Moshkov, {Mikhail Ju} and Marcin Piliszczuk",

year = "2006",

language = "English (US)",

isbn = "0819461466",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

pages = "149--155",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "High-Power Diode Laser Technology and Applications IV ; Conference date: 23-01-2006 Through 25-01-2006",

}

On partial tests and partial reducts for decision tables. / Moshkov, Mikhail Ju; Piliszczuk, Marcin.
Proceedings of SPIE - The International Society for Optical Engineering. 2006. p. 149-155 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6104).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - On partial tests and partial reducts for decision tables

AU - Moshkov, Mikhail Ju

AU - Piliszczuk, Marcin

PY - 2006

Y1 - 2006

N2 - In the paper a greedy algorithm for construction of partial tests is considered. Bounds on minimal cardinality of partial reducts are obtained. Results of experiments with software implementation of the greedy algorithm are described.

AB - In the paper a greedy algorithm for construction of partial tests is considered. Bounds on minimal cardinality of partial reducts are obtained. Results of experiments with software implementation of the greedy algorithm are described.

KW - Greedy algorithm

KW - Partial cover

KW - Partial reduct

KW - Partial test

UR - http://www.scopus.com/inward/record.url?scp=33645957694&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:33645957694

SN - 0819461466

SN - 9780819461469

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 149

EP - 155

BT - Proceedings of SPIE - The International Society for Optical Engineering

T2 - High-Power Diode Laser Technology and Applications IV

Y2 - 23 January 2006 through 25 January 2006

ER -

On partial tests and partial reducts for decision tables

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

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Cite this