Abstract
Recently, ReRAM-based hardware accelerators showed unprecedented performance compared the digital accelerators. Technology scaling causes an inevitable increase in interconnect wire resistance, which leads to IR drops that could limit the performance of ReRAM-based accelerators. These IR drops deteriorate the signal integrity and quality especially in the Crossbar structures which are used to build high density ReRAMs. Hence, finding a software solution that can predict the effect of IR drop without involving expensive hardware or SPICE simulations, is very desirable. In this paper, we propose two neural networks models to predict the impact of the IR drop problem. These models are uded to evaluate the performance of the different deep neural networks (DNNs) models including binary and quantized neural networks showing similar performance (i.e., recognition accuracy) to the golden validation (i.e., SPICE-based DNN validation). In addition, these predication models are incorporated into DNNs training framework to efficiently retrain the DNN models and bridge the accuracy drop. To further enhance the validation accuracy, we propose incremental training methods. The DNN validation results, done through SPICE simulations, show very high improvement in performance close to the baseline performance, which demonstrates the efficacy of the proposed method even with challenging datasets such as CIFAR10 and SVHN.
Original language | English (US) |
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Pages (from-to) | 1-1 |
Number of pages | 1 |
Journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
DOIs | |
State | Published - May 23 2022 |
Bibliographical note
KAUST Repository Item: Exported on 2022-05-26Acknowledgements: This work was supported by Samsung Advanced Institute of Technology, NRF grants funded by MSIT of Korea (No. 2016M3A7B4909668, No. 2017R1D1A1B03033591, No. 2020R1A2C2015066), and Free Innovative Research Fund of UNIST (1.170067.01).
ASJC Scopus subject areas
- Computer Graphics and Computer-Aided Design
- Software
- Electrical and Electronic Engineering