Off-axis low coherence interferometry contouring

Yves Delacrétaz*, Nicolas Pavillon, Florian Lang, Christian Depeursinge

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


In this article we present a method to achieve tri-dimensional contouring of macroscopic objects. A modified reference wave speckle interferometer is used in conjunction with a source of reduced coherence. The depth signal is given by the envelope of the interference signal, directly determined by the coherence length of the source. Fringes are detected in the interferogram obtained by a single shot and are detected by means of adequate filtering. With the approach based on off-axis configuration, a contour line can be extracted from a single acquisition, thus allowing to use the system in harsh environment.

Original languageEnglish (US)
Pages (from-to)4595-4601
Number of pages7
JournalOptics Communications
Issue number23
StatePublished - Dec 1 2009
Externally publishedYes


  • Contouring
  • Interferometry
  • Low coherence
  • Off-axis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering


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