Off-axis low coherence interferometry contouring

Yves Delacrétaz; Nicolas Pavillon; Florian Lang; Christian Depeursinge

doi:10.1016/j.optcom.2009.08.048

Off-axis low coherence interferometry contouring

Yves Delacrétaz^*, Nicolas Pavillon, Florian Lang, Christian Depeursinge

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

In this article we present a method to achieve tri-dimensional contouring of macroscopic objects. A modified reference wave speckle interferometer is used in conjunction with a source of reduced coherence. The depth signal is given by the envelope of the interference signal, directly determined by the coherence length of the source. Fringes are detected in the interferogram obtained by a single shot and are detected by means of adequate filtering. With the approach based on off-axis configuration, a contour line can be extracted from a single acquisition, thus allowing to use the system in harsh environment.

Original language	English (US)
Pages (from-to)	4595-4601
Number of pages	7
Journal	Optics Communications
Volume	282
Issue number	23
DOIs	https://doi.org/10.1016/j.optcom.2009.08.048
State	Published - Dec 1 2009
Externally published	Yes

Keywords

Contouring
Interferometry
Low coherence
Off-axis

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Physical and Theoretical Chemistry
Electrical and Electronic Engineering

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10.1016/j.optcom.2009.08.048

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title = "Off-axis low coherence interferometry contouring",

abstract = "In this article we present a method to achieve tri-dimensional contouring of macroscopic objects. A modified reference wave speckle interferometer is used in conjunction with a source of reduced coherence. The depth signal is given by the envelope of the interference signal, directly determined by the coherence length of the source. Fringes are detected in the interferogram obtained by a single shot and are detected by means of adequate filtering. With the approach based on off-axis configuration, a contour line can be extracted from a single acquisition, thus allowing to use the system in harsh environment.",

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author = "Yves Delacr{\'e}taz and Nicolas Pavillon and Florian Lang and Christian Depeursinge",

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doi = "10.1016/j.optcom.2009.08.048",

language = "English (US)",

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TY - JOUR

T1 - Off-axis low coherence interferometry contouring

AU - Delacrétaz, Yves

AU - Pavillon, Nicolas

AU - Lang, Florian

AU - Depeursinge, Christian

PY - 2009/12/1

Y1 - 2009/12/1

N2 - In this article we present a method to achieve tri-dimensional contouring of macroscopic objects. A modified reference wave speckle interferometer is used in conjunction with a source of reduced coherence. The depth signal is given by the envelope of the interference signal, directly determined by the coherence length of the source. Fringes are detected in the interferogram obtained by a single shot and are detected by means of adequate filtering. With the approach based on off-axis configuration, a contour line can be extracted from a single acquisition, thus allowing to use the system in harsh environment.

AB - In this article we present a method to achieve tri-dimensional contouring of macroscopic objects. A modified reference wave speckle interferometer is used in conjunction with a source of reduced coherence. The depth signal is given by the envelope of the interference signal, directly determined by the coherence length of the source. Fringes are detected in the interferogram obtained by a single shot and are detected by means of adequate filtering. With the approach based on off-axis configuration, a contour line can be extracted from a single acquisition, thus allowing to use the system in harsh environment.

KW - Contouring

KW - Interferometry

KW - Low coherence

KW - Off-axis

UR - http://www.scopus.com/inward/record.url?scp=70349878373&partnerID=8YFLogxK

U2 - 10.1016/j.optcom.2009.08.048

DO - 10.1016/j.optcom.2009.08.048

M3 - Article

AN - SCOPUS:70349878373

SN - 0030-4018

VL - 282

SP - 4595

EP - 4601

JO - Optics Communications

JF - Optics Communications

IS - 23

ER -

Off-axis low coherence interferometry contouring

Abstract

Keywords

ASJC Scopus subject areas

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