Abstract
In this work we present a numerical evaluation of the forces in an optical tweezers system, for metallic nanoparticles in the Rayleigb regime. Initially a Gaussian beam is described in the scalar approximation, and fee forces it can apply on Rayleigh dielectric and metallic particles are computed within the point-dipole approach. The method is then extended to dielectric and metallic Rayleiglt particles in a Lageerre-Gaussian beam, i.e. a higher order beam that is increasingly used for optical trapping experiments. We discuss the limits of the approximation for the beam intensity by comparing the numerical results with the experimental measurements that can be found in literature.
Original language | English (US) |
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Article number | 597205 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5972 |
DOIs | |
State | Published - 2005 |
Externally published | Yes |
Event | Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II - Bucharest, Romania Duration: Nov 24 2004 → Nov 26 2004 |
Keywords
- Laguerre-Gaussian beam
- Metallic nanoparticles
- Optical tweezers
- Rayleigh particles
- Trapping force
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering