Near-field scanning optical microscopy with an active probe

Qiaoqiang Gan, Guofeng Song, Guohua Yang, Yun Xu, Jianxia Gao, Yuzhang Li, Qing Cao, Lianghui Chen, Haiwei Lu, Zhonghao Chen, Wei Zeng, Rongjin Yan

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

A near-field scanning optical microscopy (NSOM) system employing a very-small-aperture laser (VSAL) as an active probe is reported in this Letter. The VSAL in our experiment has an aperture size of 300 nm×300 nm and a near-field spot size of about 600 nm. The resolution of the NSOM system with the VSAL can reach about 600 nm, and even 400 nm. Considering the high output power of the VSAL, such a NSOM system is a potentially useful tool for nanodetection, data storage, nanolithography, and nanobiology. © 2006 American Institute of Physics.
Original languageEnglish (US)
JournalApplied Physics Letters
Volume88
Issue number12
DOIs
StatePublished - Mar 20 2006
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this