Abstract
In this work, the implementation of an electron-selective TiO2 contact into n-type silicon solar cells is presented for the first time. The surface passivation performance of atomic layer deposition (ALD) ultrathin TiO2 on n-type silicon is investigated. Ultrathin TiO2 film is shown to afford good passivation to non-diffused n-type silicon surface. N-type silicon solar cell with an efficiency of up to 19.8% has been achieved with the implementation of an electron-selective TiO2 contact at the rear. The cell efficiency is demonstrated to be mainly limited by the degraded passivation quality of TiO2 film during contact formation annealing at a high temperature. The results show the potential to fabricate high efficiency silicon solar cells with a simple implementation of electron-selective TiO2 contact.
Original language | English (US) |
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Title of host publication | 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781479979448 |
DOIs | |
State | Published - Dec 14 2015 |
Externally published | Yes |
Event | 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States Duration: Jun 14 2015 → Jun 19 2015 |
Publication series
Name | 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 |
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Other
Other | 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 |
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Country/Territory | United States |
City | New Orleans |
Period | 06/14/15 → 06/19/15 |
Bibliographical note
Publisher Copyright:© 2015 IEEE.
Keywords
- heterojunction
- silicon
- solar cells
- titanium oxide
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials