TY - GEN
T1 - Multibit Memory Cells Based on Spin-Orbit Torque Driven Magnetization Switching of Nanomagnets with Configurational Anisotropy
AU - Wasef, Shaik
AU - Amara, Selma
AU - Alawein, Meshal
AU - Fariborzi, Hossein
N1 - KAUST Repository Item: Exported on 2021-09-14
PY - 2018/9/7
Y1 - 2018/9/7
N2 - In this work, we report the fabrication and characterization of novel four and six terminal current-driven magnetic memory cells. In particular, we experimentally demonstrate the magnetization switching of triangular and square magnets through spin-orbit torque by in-plane currents in a Pt/NiFe (Py) heterostructure. The spin torques, generated by applying a constant current in one of multiple Pt wires, are used to switch a Py film between its multiple stable magnetic states, as quantified by anisotropic magnetoresistance (AMR) and tunnel magnetoresistance (TMR) measurements at room temperature. The observations have also been confirmed by micromagnetic simulations.
AB - In this work, we report the fabrication and characterization of novel four and six terminal current-driven magnetic memory cells. In particular, we experimentally demonstrate the magnetization switching of triangular and square magnets through spin-orbit torque by in-plane currents in a Pt/NiFe (Py) heterostructure. The spin torques, generated by applying a constant current in one of multiple Pt wires, are used to switch a Py film between its multiple stable magnetic states, as quantified by anisotropic magnetoresistance (AMR) and tunnel magnetoresistance (TMR) measurements at room temperature. The observations have also been confirmed by micromagnetic simulations.
UR - http://hdl.handle.net/10754/628839
UR - https://ieeexplore.ieee.org/document/8421415
UR - http://www.scopus.com/inward/record.url?scp=85051516396&partnerID=8YFLogxK
U2 - 10.1109/EDTM.2018.8421415
DO - 10.1109/EDTM.2018.8421415
M3 - Conference contribution
AN - SCOPUS:85051516396
SN - 9781538637128
SP - 298
EP - 300
BT - 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -