Abstract
Face detection is a classical problem in computer vision. It is still a difficult task due to many nuisances that naturally occur in the wild. In this paper, we propose a multi-scale fully convolutional network for face detection. To reduce computation, the intermediate convolutional feature maps (conv) are shared by every scale model. We up-sample and down-sample the final conv map to approximate K levels of a feature pyramid, leading to a wide range of face scales that can be detected. At each feature pyramid level, a FCN is trained end-to-end to deal with faces in a small range of scale change. Because of the up-sampling, our method can detect very small faces (10×10 pixels). We test our MS-FCN detector on four public face detection datasets, including FDDB, WIDER FACE, AFW and PASCAL FACE. Extensive experiments show that it outperforms state-of-the-art methods. Also, MS-FCN runs at 23 FPS on a GPU for images of size 640×480 with no assumption on the minimum detectable face size.
Original language | English (US) |
---|---|
Title of host publication | Proceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017 |
Publisher | IEEE Computer Society |
Pages | 2078-2087 |
Number of pages | 10 |
ISBN (Electronic) | 9781538607336 |
DOIs | |
State | Published - Aug 22 2017 |
Event | 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017 - Honolulu, United States Duration: Jul 21 2017 → Jul 26 2017 |
Publication series
Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
---|---|
Volume | 2017-July |
ISSN (Print) | 2160-7508 |
ISSN (Electronic) | 2160-7516 |
Conference
Conference | 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017 |
---|---|
Country/Territory | United States |
City | Honolulu |
Period | 07/21/17 → 07/26/17 |
Bibliographical note
Publisher Copyright:© 2017 IEEE.
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Computer Vision and Pattern Recognition