Abstract
Estimating the Remaining Useful Life (RUL) allows for effective machine maintenance and cost reduction. Lately, RUL estimation has shifted to data-driven methods, emphasizing autoencoder (AE) architectures and similarity-based metrics. However, current approaches often overlook failure modes in constructing health index (HI) libraries, impacting accuracy. This work proposes a RUL estimator using AE and similarity, explicitly considering failure modes. It adopts a multi-class approach, categorizing processing paths based on distinct failure modes. An online classifier identifies the failure mode from input data, guiding the RUL prediction phase for more accurate estimates. This approach enhances accuracy by tailoring data processing to the failure class, capturing patterns for precise estimation. Experiments using the C-MAPSS aircraft engine simulator dataset compare the proposed scheme with a reference case ignoring failure classes, emphasizing the significance of considering distinct failure modes in RUL estimation.
Original language | English (US) |
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Title of host publication | I2MTC 2024 - Instrumentation and Measurement Technology Conference |
Subtitle of host publication | Instrumentation and Measurement for Sustainable Future, Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9798350380903 |
DOIs | |
State | Published - 2024 |
Event | 2024 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2024 - Glasgow, United Kingdom Duration: May 20 2024 → May 23 2024 |
Publication series
Name | Conference Record - IEEE Instrumentation and Measurement Technology Conference |
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ISSN (Print) | 1091-5281 |
Conference
Conference | 2024 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2024 |
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Country/Territory | United Kingdom |
City | Glasgow |
Period | 05/20/24 → 05/23/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- Autoencoder
- Health in-dex
- Machine prognostics
- Multi-class
- Remaining useful life
- Similarity model
ASJC Scopus subject areas
- Electrical and Electronic Engineering