Abstract
A novel approach for the simulation of the field back-scattered from a rough surface is presented. It takes into account polarization and multiple scattering events on the surface, as well as diffraction effects. The validity and usefulness of this simulation is demonstrated in the case of surface topology measurement.
Original language | English (US) |
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Pages (from-to) | 270-277 |
Number of pages | 8 |
Journal | Journal of the Optical Society of America A: Optics and Image Science, and Vision |
Volume | 29 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2012 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Computer Vision and Pattern Recognition