Monte Carlo simulation of the field back-scattered from rough surfaces

Yves Delacrétaz*, Olivier Seydoux, Stéphane Chamot, Andreas Ettemeyer, Christian Depeursinge

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


A novel approach for the simulation of the field back-scattered from a rough surface is presented. It takes into account polarization and multiple scattering events on the surface, as well as diffraction effects. The validity and usefulness of this simulation is demonstrated in the case of surface topology measurement.

Original languageEnglish (US)
Pages (from-to)270-277
Number of pages8
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Issue number3
StatePublished - Mar 2012
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition


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