Monitoring morphological changes in 2D monolayer semiconductors using atom-thick plasmonic nanocavities

Daniel O. Sigle, Jan Mertens, Lars O. Herrmann, Richard W. Bowman, Sandrine Ithurria, Benoit Dubertret, Yumeng Shi, Hui Ying Yang, Christos Tserkezis, Javier Aizpurua, Jeremy J. Baumberg*

*Corresponding author for this work

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