Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities

Joseph Cina; Lawrence Carin

Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities

Joseph Cina, Lawrence Carin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.

Original language	English (US)
Title of host publication	IEEE MTT-S International Microwave Symposium Digest
Publisher	IEEEPiscataway, NJ, United States
Pages	225-228
Number of pages	4
State	Published - Jan 1 1995
Externally published	Yes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2021-02-09

Cite this

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title = "Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities",

abstract = "The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.",

author = "Joseph Cina and Lawrence Carin",

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year = "1995",

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AU - Cina, Joseph

AU - Carin, Lawrence

N1 - Generated from Scopus record by KAUST IRTS on 2021-02-09

PY - 1995/1/1

Y1 - 1995/1/1

N2 - The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.

AB - The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.

UR - http://www.scopus.com/inward/record.url?scp=0029220621&partnerID=8YFLogxK

M3 - Conference contribution

SP - 225

EP - 228

BT - IEEE MTT-S International Microwave Symposium Digest

PB - IEEEPiscataway, NJ, United States

ER -

Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities

Abstract

Bibliographical note

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