Abstract
In this paper, we present a magnetic force microscopy (MFM) study of the magnetic dot patterns of different dimensions and spacings. The magnetic dot arrays were obtained using a focused-ion-beam etching technique on a commercial postsputtering longitudinal recording disk media. The "transitions" were created by the discontinuity of magnetization at the edges of each dot. The MFM observation was employed to study the magnetic property of each dot and the dipulse of two transitions created at the edges of two adjacent dots versus different dot spacings. The single domain structures were formed spontaneously as the dot dimension was reduced to 200 nm or less. The dipulse was still observed as the spacing between the dots is reduced to around 10 nm.
Original language | English (US) |
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Pages (from-to) | 2432-2434 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 38 |
Issue number | 5 I |
DOIs | |
State | Published - Sep 2002 |
Externally published | Yes |
Event | 2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002 |
Keywords
- Dipulse
- Focused ion beam
- MFM
- Magnetic dot patterns
- Single domain
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering