MFM study of magnetic bit patterns of different dimensions

Dan You; Yuankai Zheng; Zhiyong Liu; Zaibing Guo; Yihong Wu

doi:10.1109/INTMAG.2002.1001099

MFM study of magnetic bit patterns of different dimensions

Dan You, Yuankai Zheng, Zhiyong Liu, Zaibing Guo, Yihong Wu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The focused ion beam (FIB) technique was utilized to pattern the commercial post-sputtering longitudinal recording media into individual bits of different dimensions. A number of horizontal and vertical lines were milled to separate the bits. The MFM observation was employed to study the magnetic property of each bit and the interaction between "transitions" created by the discontinuity of magnetization at the edges of bits. The single domain structures were formed spontaneously as the bit dimension is reduced to 200 nm or less. We demonstrate the new interplay between the magnetostatic energy and exchange energy for patterned media bits.

Original language	English (US)
Title of host publication	INTERMAG Europe 2002 - IEEE International Magnetics Conference
Editors	J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780373650, 9780780373655
DOIs	https://doi.org/10.1109/INTMAG.2002.1001099
State	Published - 2002
Externally published	Yes
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002

Publication series

Name	INTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/Territory	Netherlands
City	Amsterdam
Period	04/28/02 → 05/2/02

Bibliographical note

Publisher Copyright:
©2002 IEEE.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering
Surfaces, Coatings and Films

Access to Document

10.1109/INTMAG.2002.1001099

Cite this

You, D., Zheng, Y., Liu, Z., Guo, Z., & Wu, Y. (2002). MFM study of magnetic bit patterns of different dimensions. In J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, J. De Boeck, & R. Wood (Eds.), INTERMAG Europe 2002 - IEEE International Magnetics Conference Article 1001099 (INTERMAG Europe 2002 - IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001099

You, Dan ; Zheng, Yuankai ; Liu, Zhiyong et al. / MFM study of magnetic bit patterns of different dimensions. INTERMAG Europe 2002 - IEEE International Magnetics Conference. editor / J. Fidler ; B. Hillebrands ; C. Ross ; D. Weller ; L. Folks ; E. Hill ; M. Vazquez Villalabeitia ; J. A. Bain ; Jo De Boeck ; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

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author = "Dan You and Yuankai Zheng and Zhiyong Liu and Zaibing Guo and Yihong Wu",

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year = "2002",

doi = "10.1109/INTMAG.2002.1001099",

language = "English (US)",

series = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",

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You, D, Zheng, Y, Liu, Z, Guo, Z & Wu, Y 2002, MFM study of magnetic bit patterns of different dimensions. in J Fidler, B Hillebrands, C Ross, D Weller, L Folks, E Hill, M Vazquez Villalabeitia, JA Bain, J De Boeck & R Wood (eds), INTERMAG Europe 2002 - IEEE International Magnetics Conference., 1001099, INTERMAG Europe 2002 - IEEE International Magnetics Conference, Institute of Electrical and Electronics Engineers Inc., 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002, Amsterdam, Netherlands, 04/28/02. https://doi.org/10.1109/INTMAG.2002.1001099

MFM study of magnetic bit patterns of different dimensions. / You, Dan; Zheng, Yuankai; Liu, Zhiyong et al.
INTERMAG Europe 2002 - IEEE International Magnetics Conference. ed. / J. Fidler; B. Hillebrands; C. Ross; D. Weller; L. Folks; E. Hill; M. Vazquez Villalabeitia; J. A. Bain; Jo De Boeck; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. 1001099 (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - The focused ion beam (FIB) technique was utilized to pattern the commercial post-sputtering longitudinal recording media into individual bits of different dimensions. A number of horizontal and vertical lines were milled to separate the bits. The MFM observation was employed to study the magnetic property of each bit and the interaction between "transitions" created by the discontinuity of magnetization at the edges of bits. The single domain structures were formed spontaneously as the bit dimension is reduced to 200 nm or less. We demonstrate the new interplay between the magnetostatic energy and exchange energy for patterned media bits.

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You D, Zheng Y, Liu Z, Guo Z, Wu Y. MFM study of magnetic bit patterns of different dimensions. In Fidler J, Hillebrands B, Ross C, Weller D, Folks L, Hill E, Vazquez Villalabeitia M, Bain JA, De Boeck J, Wood R, editors, INTERMAG Europe 2002 - IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc. 2002. 1001099. (INTERMAG Europe 2002 - IEEE International Magnetics Conference). doi: 10.1109/INTMAG.2002.1001099

MFM study of magnetic bit patterns of different dimensions

Abstract

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Bibliographical note

ASJC Scopus subject areas

Access to Document

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