MFM study of magnetic bit patterns of different dimensions

Dan You*, Yuankai Zheng, Zhiyong Liu, Zaibing Guo, Yihong Wu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review


The magnetic force microscopy (MFM) was used to study the magnetic property of each bit and the interaction between the transitions created by the discontinuity of magnetization at the edges of bits. The single domain structures were formed as the bit dimension was reduced to 200 nm or less. The interplay between the magnetostatic energy and exchange energy for the patterned media bits was demonstrated.

Original languageEnglish (US)
Pages (from-to)DU02
JournalDigests of the Intermag Conference
StatePublished - 2002
Externally publishedYes
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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