Metrology System Based on Metasurface Implementation of Artificial Inteligence

Arturo Burguete-Lopez; Maksim Makarenko; Qizhou Wang; Fedor Getman; Andrea Fratalocchi

doi:10.1109/CLEO/EUROPE-EQEC57999.2023.10231970

Metrology System Based on Metasurface Implementation of Artificial Inteligence

Arturo Burguete-Lopez, Maksim Makarenko, Qizhou Wang, Fedor Getman, Andrea Fratalocchi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3-5].

Original language	English (US)
Title of host publication	2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798350345995
DOIs	https://doi.org/10.1109/CLEO/EUROPE-EQEC57999.2023.10231970
State	Published - 2023
Event	2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023 - Munich, Germany Duration: Jun 26 2023 → Jun 30 2023

Publication series

Name	2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023

Conference

Conference	2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
Country/Territory	Germany
City	Munich
Period	06/26/23 → 06/30/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Instrumentation
Atomic and Molecular Physics, and Optics

Access to Document

10.1109/CLEO/EUROPE-EQEC57999.2023.10231970

Cite this

Burguete-Lopez, A., Makarenko, M., Wang, Q., Getman, F., & Fratalocchi, A. (2023). Metrology System Based on Metasurface Implementation of Artificial Inteligence. In 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023 (2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEO/EUROPE-EQEC57999.2023.10231970

Burguete-Lopez, Arturo ; Makarenko, Maksim ; Wang, Qizhou et al. / Metrology System Based on Metasurface Implementation of Artificial Inteligence. 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023).

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abstract = "Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3-5].",

author = "Arturo Burguete-Lopez and Maksim Makarenko and Qizhou Wang and Fedor Getman and Andrea Fratalocchi",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023 ; Conference date: 26-06-2023 Through 30-06-2023",

year = "2023",

doi = "10.1109/CLEO/EUROPE-EQEC57999.2023.10231970",

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series = "2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023",

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Burguete-Lopez, A, Makarenko, M, Wang, Q, Getman, F & Fratalocchi, A 2023, Metrology System Based on Metasurface Implementation of Artificial Inteligence. in 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023. 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023, Institute of Electrical and Electronics Engineers Inc., 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023, Munich, Germany, 06/26/23. https://doi.org/10.1109/CLEO/EUROPE-EQEC57999.2023.10231970

Metrology System Based on Metasurface Implementation of Artificial Inteligence. / Burguete-Lopez, Arturo; Makarenko, Maksim; Wang, Qizhou et al.
2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Burguete-Lopez, Arturo

AU - Makarenko, Maksim

AU - Wang, Qizhou

AU - Getman, Fedor

AU - Fratalocchi, Andrea

PY - 2023

Y1 - 2023

N2 - Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3-5].

AB - Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3-5].

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DO - 10.1109/CLEO/EUROPE-EQEC57999.2023.10231970

M3 - Conference contribution

AN - SCOPUS:85175704617

T3 - 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023

BT - 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023

Y2 - 26 June 2023 through 30 June 2023

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Burguete-Lopez A, Makarenko M, Wang Q, Getman F, Fratalocchi A. Metrology System Based on Metasurface Implementation of Artificial Inteligence. In 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023). doi: 10.1109/CLEO/EUROPE-EQEC57999.2023.10231970

Metrology System Based on Metasurface Implementation of Artificial Inteligence

Abstract

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Bibliographical note

ASJC Scopus subject areas

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