Metrology System Based on Metasurface Implementation of Artificial Inteligence

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Optical instrumentation is ubiquitous across scientific disciplines and industrial settings for its ability to deliver non-destructive and high accuracy mesurements [1]. However, as global manufacturing transitions an automated industry paradigm, the need for highly integrated metrology systems for autonomous machines cannot be addressed traditional bulk optics based equipment [2]. Metasurfaces provide a possible solution to this challenge, enabling near-arbitrary light control functionality in a compact form factor [3-5].

Original languageEnglish (US)
Title of host publication2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350345995
DOIs
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023 - Munich, Germany
Duration: Jun 26 2023Jun 30 2023

Publication series

Name2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
Country/TerritoryGermany
CityMunich
Period06/26/2306/30/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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