Memory effect by charging of ultra-small 2-nm laser-synthesized solution processable Si-nanoparticles embedded in Si–Al2O3–SiO2structure [Phys. Status Solidi A 212, 1751–1755 (2015)] (Appl. Phys. Lett., (2014), 104, (13112), 10.1002/pssa.201431802)

Nazek El-Atab*, Ayman Rizk, Burak Tekcan, Sabri Alkis, Ali K. Okyay, Ammar Nayfeh

*Corresponding author for this work

Research output: Contribution to journalComment/debatepeer-review

1 Scopus citations

Abstract

The authors would like to make an addition to the caption of Fig. 1, notifying partly reused material from another journal. We would like to add the following in the caption of Fig. 1: Partly reused from N. El-Atab et al., Appl. Phys. Lett. 104, 013112 (2014) [4].

Original languageEnglish (US)
Pages (from-to)2264
Number of pages1
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume213
Issue number8
DOIs
StatePublished - Aug 1 2016

Bibliographical note

Publisher Copyright:
© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Keywords

  • atomic layer deposition
  • charge trapping memory
  • laser processing
  • metal–oxide–semiconductor structures
  • nanoparticles
  • silicon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Memory effect by charging of ultra-small 2-nm laser-synthesized solution processable Si-nanoparticles embedded in Si–Al2O3–SiO2structure [Phys. Status Solidi A 212, 1751–1755 (2015)] (Appl. Phys. Lett., (2014), 104, (13112), 10.1002/pssa.201431802)'. Together they form a unique fingerprint.

Cite this