Abstract
A report on the magnetoresistance in exchange-biased IrMn/NiFe/FeMn was presented. The films were deposited under a magnetic field of 100Oe and then annealed at 250 °C. The representative magnetoresistance behavior of the samples measured with an applied magnetic field parallel to currents as well as exchange bias directions were shown.
Original language | English (US) |
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Journal | Digests of the Intermag Conference |
State | Published - Dec 1 2002 |
Event | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering