Magnetic order in a submicron patterned permalloy film studied by resonant x-ray scattering

Carlo Spezzani; Mauro Fabrizioli; Patrizio Candeloro; Enzo Di Fabrizio; Giancarlo Panaccione; Maurizio Sacchil

doi:10.1103/PhysRevB.69.224412

Magnetic order in a submicron patterned permalloy film studied by resonant x-ray scattering

Carlo Spezzani^*, Mauro Fabrizioli, Patrizio Candeloro, Enzo Di Fabrizio, Giancarlo Panaccione, Maurizio Sacchil

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

We have used specular and off-specular x-ray scattering to follow the field dependent magnetization in an array of 1000 nm × 350 nm permalloy rectangles. Sensitivity to the magnetic properties of the permalloy was obtained by tuning the x-ray energy to the Fe 2p resonance. The corresponding wavelength matches the Bragg condition for the regular horizontal structure of the pattern. The magnetic behavior was found to depend on the orientation of the field with respect to the rectangles: we observed the presence of a strong magnetic anisotropy induced by the patterning, with a magnetic hard axis in the direction of the shorter side of the rectangles.

Original language	English (US)
Article number	224412
Pages (from-to)	224412-1-224412-7
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	69
Issue number	22
DOIs	https://doi.org/10.1103/PhysRevB.69.224412
State	Published - Jun 2004
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1103/PhysRevB.69.224412

Cite this

@article{8fbf2e526b3644308dfc869e3d6939ad,

title = "Magnetic order in a submicron patterned permalloy film studied by resonant x-ray scattering",

abstract = "We have used specular and off-specular x-ray scattering to follow the field dependent magnetization in an array of 1000 nm × 350 nm permalloy rectangles. Sensitivity to the magnetic properties of the permalloy was obtained by tuning the x-ray energy to the Fe 2p resonance. The corresponding wavelength matches the Bragg condition for the regular horizontal structure of the pattern. The magnetic behavior was found to depend on the orientation of the field with respect to the rectangles: we observed the presence of a strong magnetic anisotropy induced by the patterning, with a magnetic hard axis in the direction of the shorter side of the rectangles.",

author = "Carlo Spezzani and Mauro Fabrizioli and Patrizio Candeloro and {Di Fabrizio}, Enzo and Giancarlo Panaccione and Maurizio Sacchil",

year = "2004",

month = jun,

doi = "10.1103/PhysRevB.69.224412",

language = "English (US)",

volume = "69",

pages = "224412--1--224412--7",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "0163-1829",

publisher = "American Institute of Physics",

number = "22",

}

TY - JOUR

T1 - Magnetic order in a submicron patterned permalloy film studied by resonant x-ray scattering

AU - Spezzani, Carlo

AU - Fabrizioli, Mauro

AU - Candeloro, Patrizio

AU - Di Fabrizio, Enzo

AU - Panaccione, Giancarlo

AU - Sacchil, Maurizio

PY - 2004/6

Y1 - 2004/6

N2 - We have used specular and off-specular x-ray scattering to follow the field dependent magnetization in an array of 1000 nm × 350 nm permalloy rectangles. Sensitivity to the magnetic properties of the permalloy was obtained by tuning the x-ray energy to the Fe 2p resonance. The corresponding wavelength matches the Bragg condition for the regular horizontal structure of the pattern. The magnetic behavior was found to depend on the orientation of the field with respect to the rectangles: we observed the presence of a strong magnetic anisotropy induced by the patterning, with a magnetic hard axis in the direction of the shorter side of the rectangles.

AB - We have used specular and off-specular x-ray scattering to follow the field dependent magnetization in an array of 1000 nm × 350 nm permalloy rectangles. Sensitivity to the magnetic properties of the permalloy was obtained by tuning the x-ray energy to the Fe 2p resonance. The corresponding wavelength matches the Bragg condition for the regular horizontal structure of the pattern. The magnetic behavior was found to depend on the orientation of the field with respect to the rectangles: we observed the presence of a strong magnetic anisotropy induced by the patterning, with a magnetic hard axis in the direction of the shorter side of the rectangles.

UR - http://www.scopus.com/inward/record.url?scp=42749099575&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.69.224412

DO - 10.1103/PhysRevB.69.224412

M3 - Article

AN - SCOPUS:42749099575

SN - 0163-1829

VL - 69

SP - 224412-1-224412-7

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 22

M1 - 224412

ER -

Magnetic order in a submicron patterned permalloy film studied by resonant x-ray scattering

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this