Abstract
High-speed solution shearing, in which a drop of dissolved material is spread by a coating knife onto the substrate, has emerged as a versatile, yet simple coating technique to prepare high-mobility organic thin film transistors. Solution shearing and subsequent drying and crystallization of a thin film of conjugated molecules is probed in situ using microbeam grazing incidence wide-angle X-ray scattering (μGIWAXS). We demonstrate the advantages of this approach to study solution based crystal nucleation and growth, and identify casting parameter combinations to cast highly ordered and laterally aligned molecular thin films. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 177-179 |
| Number of pages | 3 |
| Journal | physica status solidi (RRL) - Rapid Research Letters |
| Volume | 7 |
| Issue number | 3 |
| DOIs | |
| State | Published - Dec 20 2012 |
Bibliographical note
KAUST Repository Item: Exported on 2020-10-01Acknowledged KAUST grant number(s): FIC/2010/04, KUS-C1-015-21
Acknowledgements: We are deeply indebted to the CHESS staff for making these experiments happen. CHESS is supported by the NSF & NIH/NIGMS via NSF award DMR-0936384. The Stanford portion of this work was supported by the Center for Advanced Molecular Photovoltaics, Award No. KUS-C1-015-21, by KAUST and the NSF (DMR-0705687-002). Part of this work was supported by KAUST's Office of Competitive Research Funds under award number FIC/2010/04.
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics