Leakage effects in broadside-coupled microstrip

Lawrence Carin

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Broadside-coupled microstrip with and without conducting side walls is studied using a full-wave spectral-domain analysis. Special attention is directed towards possible leakage to the parallel plate mode and its potential effects in practical integrated circuits. It is asserted that for certain geometrical parameters, broadside-coupled microstrip can be leaky at all frequencies. Comparisons between the modes on broadside-coupled microstrip with and without side walls are made by means of dispersion curves.
Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherPubl by IEEEPiscataway, NJ, United States
Number of pages4
StatePublished - Dec 1 1991
Externally publishedYes

Bibliographical note

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