Layer-by-Layer-Assembled High-Performance Broadband Antireflection Coatings

Hiroomi Shimomura, Zekeriyya Gemici, Robert E. Cohen, Michael F. Rubner

Research output: Contribution to journalArticlepeer-review

123 Scopus citations

Abstract

Nanoparticles are indispensable ingredients of solution-processed optical, dielectric, and catalytic thin films. Although solution-based methods are promising low-cost alternatives to vacuum methods, they can have significant limitations. Coating uniformity, thickness control, roughness control, mechanical durability, and incorporation of a diverse set of functional organic molecules into nanoparticle thin films are major challenges. We have used the electrostatic layer-by-layer assembly technique to make uniform, conformal multistack nanoparticle thin films for optical applications with precise thickness control over each stack. Two particularly sought-after optical applications are broadband antireflection and structural color. The effects of interstack and surface roughness on optical properties of these constructs (e.g., haze and spectral response) have been studied quantitatively using a combination of Fourier-transform methods and atomic force microscopy measurements. Deconvoluting root-mean-square roughness into its large-, intermediate-, and small-scale components enables enhanced optical simulations. A 4-stack broadband antireflection coating (
Original languageEnglish (US)
Pages (from-to)813-820
Number of pages8
JournalACS Applied Materials & Interfaces
Volume2
Issue number3
DOIs
StatePublished - Feb 23 2010
Externally publishedYes

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): 06/2008
Acknowledgements: We thank JSR Corporation and the MIT MRSEC program of the National Science Foundation (Grant DMR 03-13282) for funding; the Center for Materials Science and Engineering (CMSE) and the Institute for Soldier Nanotechnologies (ISN) for access to shared equipment facilities: Dr. Larry Domash of Agiltron Inc for optical modeling using the Needle algorithm. Z.G. thanks KAUST for fellowship support (beginning 06/2008).
This publication acknowledges KAUST support, but has no KAUST affiliated authors.

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