Abstract
A scalable and catalyst-free method to deposit stoichiometric Molybdenum Disulfide (MoS2) films over large areas is reported with the maximum area limited by the size of the substrate holder. The method allows deposition of MoS2 layers on a wide range of substrates without any additional surface preparation including single crystals (sapphire and quartz), polycrystalline (HfO2), and amorphous (SiO2). The films are deposited using carefully designed MoS2 targets fabricated with excess of sulfur (S) and variable MoS2 and S particle size. Uniform and layered MoS2 films as thin as two monolayers, with an electrical resistivity of 1.54 × 104 Ω cm-1 were achieved. The MoS2 stoichiometry was as confirmed by High Resolution Rutherford Backscattering Spectrometry (HRRBS). With the method reported here, in situ graded MoS2 films ranging from ~1 to 10 monolayers can also be deposited.
Original language | English (US) |
---|---|
Pages (from-to) | 6054-6061 |
Number of pages | 8 |
Journal | ACS Nano |
Volume | 10 |
Issue number | 6 |
DOIs | |
State | Published - May 31 2016 |
Bibliographical note
KAUST Repository Item: Exported on 2020-10-01Acknowledgements: The Authors want to thank the National Science Foundation- Division of Electrical,
Communications and Cyber Systems (Grant 1139986), Colciencias, Kookmin University, and
The Leading Foreign Research Institute Recruitment Program through the National Research
Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning(MSIP)
(Grant 2013K1A4A3055679).