Investigation of radiation effects on the properties of organic semiconductors using low-dose TEM analysis

Dalaver H. Anjum, Rachid Sougrat, Z. Kui, A. Amassian

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1436-1437
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612009038
State	Published - Jul 2012

ASJC Scopus subject areas

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title = "Investigation of radiation effects on the properties of organic semiconductors using low-dose TEM analysis",

author = "Anjum, {Dalaver H.} and Rachid Sougrat and Z. Kui and A. Amassian",

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AU - Anjum, Dalaver H.

AU - Sougrat, Rachid

AU - Kui, Z.

AU - Amassian, A.

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