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Integration process for photonic integrated circuits using plasma damage induced layer intermixing
B. S. Ooi
, A. C. Bryce, J. H. Marsh
Research output
:
Contribution to journal
›
Article
›
peer-review
25
Scopus citations
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Keyphrases
Band Gap
50%
Extended Cavity Laser
100%
GaAs-AlGaAs
50%
Ion Bombardment
50%
Laser Cavity
50%
Mixing Layer
100%
Photonic Integrated Circuits
100%
Plasma-induced Damage
100%
Process Integration
100%
Quantum Well Intermixing
50%
Tunable Laser
50%
Waveguide
50%
Physics
Energy Gaps (Solid State)
50%
Laser Cavity
100%
Photonic Integrated Circuits
100%
Plasma Damage
100%
Quantum Wells
50%
Waveguide
50%