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Integration process for photonic integrated circuits using plasma damage induced layer intermixing
B. S. Ooi
, A. C. Bryce, J. H. Marsh
Research output
:
Contribution to journal
›
Article
›
peer-review
25
Scopus citations
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INIS
layers
100%
plasma
100%
integrated circuits
100%
damage
100%
laser cavities
100%
lasers
50%
waveguides
50%
losses
50%
quantum wells
50%
gallium arsenides
50%
ion beams
50%
Engineering
Process Integration
100%
Integrated Circuit
100%
Plasma Damage
100%
Laser Cavity
100%
Photonics
100%
Gallium Arsenide
50%
Quantum Well
50%
Losses
50%
Aluminium Gallium Arsenide
50%
Ion Implantation
50%
Material Science
Electronic Circuit
100%
Laser
100%
Waveguide
33%
Material
33%