Inkjet-printed organic electronics: Operational stability and reliability issues

M. C.R. Medeiros; C. Martinez-Domingo; E. Ramon; A. T. Negrier; E. Sowade; K. Y. Mitra; R. R. Baumann; I. McCulloch; J. Carrabina; H. L. Gomes

doi:10.1149/05326.0001ecst

Inkjet-printed organic electronics: Operational stability and reliability issues

M. C.R. Medeiros, C. Martinez-Domingo, E. Ramon, A. T. Negrier, E. Sowade, K. Y. Mitra, R. R. Baumann, I. McCulloch, J. Carrabina, H. L. Gomes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water. © The Electrochemical Society.

Original language	English (US)
Title of host publication	ECS Transactions
Publisher	Electrochemical Society [email protected]
Pages	1-10
Number of pages	10
ISBN (Print)	9781607684787
DOIs	https://doi.org/10.1149/05326.0001ecst
State	Published - Jan 1 2013
Externally published	Yes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2023-09-21

ASJC Scopus subject areas

General Engineering

Access to Document

10.1149/05326.0001ecst

Cite this

@inproceedings{c813afbbdf78420d8b270d6aa0c23a18,

title = "Inkjet-printed organic electronics: Operational stability and reliability issues",

abstract = "The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water. {\textcopyright} The Electrochemical Society.",

author = "Medeiros, {M. C.R.} and C. Martinez-Domingo and E. Ramon and Negrier, {A. T.} and E. Sowade and Mitra, {K. Y.} and Baumann, {R. R.} and I. McCulloch and J. Carrabina and Gomes, {H. L.}",

note = "Generated from Scopus record by KAUST IRTS on 2023-09-21",

year = "2013",

month = jan,

day = "1",

doi = "10.1149/05326.0001ecst",

language = "English (US)",

isbn = "9781607684787",

pages = "1--10",

booktitle = "ECS Transactions",

publisher = "Electrochemical Society [email protected]",

}

TY - GEN

T1 - Inkjet-printed organic electronics: Operational stability and reliability issues

AU - Medeiros, M. C.R.

AU - Martinez-Domingo, C.

AU - Ramon, E.

AU - Negrier, A. T.

AU - Sowade, E.

AU - Mitra, K. Y.

AU - Baumann, R. R.

AU - McCulloch, I.

AU - Carrabina, J.

AU - Gomes, H. L.

N1 - Generated from Scopus record by KAUST IRTS on 2023-09-21

PY - 2013/1/1

Y1 - 2013/1/1

N2 - The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water. © The Electrochemical Society.

AB - The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water. © The Electrochemical Society.

UR - https://iopscience.iop.org/article/10.1149/05326.0001ecst

UR - http://www.scopus.com/inward/record.url?scp=84906670011&partnerID=8YFLogxK

U2 - 10.1149/05326.0001ecst

DO - 10.1149/05326.0001ecst

M3 - Conference contribution

SN - 9781607684787

SP - 1

EP - 10

BT - ECS Transactions

PB - Electrochemical Society [email protected]

ER -

Inkjet-printed organic electronics: Operational stability and reliability issues

Abstract

Bibliographical note

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this