Increasing manufacturing yield for wideband RF CMOS LNAs in the presence of process variations

Arthur Nieuwoudt, Tamer Ragheb, Hamid Nejati, Yehia Massoud

Research output: Chapter in Book/Report/Conference proceedingConference contribution

30 Scopus citations


In this paper, we develop several design techniques for reducing the impact of manufacturing variations on integrated wideband low noise amplifiers (LNA). Utilizing an efficient modeling and automated design methodology, we investigate the sensitivity of LNA performance metrics to process variations and determine that the input impedance matching is particularly sensitive to perturbations in component values. Based on the sensitivity analysis, we leverage several design techniques to increase the reliability of LNA designs. To mitigate the impact of process variations on the input impedance matching, we add additional circuit elements and tunable capacitors to dynamically compensate for manufacturing variations after fabrication. The results indicate that the proposed design techniques can increase manufacturing yield by up to one order of magnitude for input impedance matching with only a 14% increase in noise figure. © 2007 IEEE.
Original languageEnglish (US)
Title of host publicationProceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
Number of pages6
StatePublished - Aug 28 2007
Externally publishedYes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2022-09-13


Dive into the research topics of 'Increasing manufacturing yield for wideband RF CMOS LNAs in the presence of process variations'. Together they form a unique fingerprint.

Cite this