In situ X-ray diffraction monitoring of GaInN/GaN superlattice during organometalic vapor phase epitaxy growth

Taiji Yamamoto, Daisuke Iida, Yasunari Kondo, Mihoko Sowa, Shinya Umeda, Motoaki Iwaya, Tetsuya Takeuchi, Satoshi Kamiyama, Isamu Akasaki

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