In situ TEM of carbon nanotubes

Pedro M.F.J. Costa*, Paulo J. Ferreira

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1 Scopus citations


The recognition that in situ TEM can be used as a powerful tool for the dynamic characterization of materials has been widely established. However, with the advent of CCD and direct detection cameras, and the development in electron optics, stage design and fabrication, and recording media, scientists and engineers are now being able to further enhance the capabilities of previous TEM analysis through novel in situ experiments, by observing and recording the behavior of materials in different conditions, such as heating, cooling, stress, light, electric fields, as well as liquid and gas environments. This technique has been critical in understanding and characterizing the relationship between properties and the nano/microstructure of materials and has been important in validating the information contained in previous single static TEM experiments with a series of dynamic sequential images. In addition, the emerging development of nanomaterials, a field which has become one of the most promising fields of science and technology today, has brought an exciting resurgence of interest in in situ TEM, as the previous issue of thinning bulk specimens is no longer present.

Original languageEnglish (US)
Title of host publicationAdvanced Transmission Electron Microscopy
Subtitle of host publicationApplications to Nanomaterials
PublisherSpringer International Publishing
Number of pages42
ISBN (Electronic)9783319151779
ISBN (Print)9783319151762
StatePublished - Jan 1 2015

Bibliographical note

Publisher Copyright:
© Springer International Publishing Switzerland 2015.

ASJC Scopus subject areas

  • General Engineering
  • General Materials Science
  • General Biochemistry, Genetics and Molecular Biology


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