In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

D. Golberg; P. M.F.J. Costa; M. Mitome; Y. Bando

doi:10.1109/INEC.2008.4585680

In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

D. Golberg^*, P. M.F.J. Costa, M. Mitome, Y. Bando

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO₂ and pure multi-walled BN nanotubes.

Original language	English (US)
Title of host publication	2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
Pages	1127-1131
Number of pages	5
DOIs	https://doi.org/10.1109/INEC.2008.4585680
State	Published - 2008
Externally published	Yes
Event	2008 2nd IEEE International Nanoelectronics Conference, INEC 2008 - Shanghai, China Duration: Mar 24 2008 → Mar 27 2008

Publication series

Name	2008 2nd IEEE International Nanoelectronics Conference, INEC 2008

Other

Other	2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
Country/Territory	China
City	Shanghai
Period	03/24/08 → 03/27/08

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/INEC.2008.4585680

Cite this

Golberg, D., Costa, P. M. F. J., Mitome, M., & Bando, Y. (2008). In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials. In 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008 (pp. 1127-1131). Article 4585680 (2008 2nd IEEE International Nanoelectronics Conference, INEC 2008). https://doi.org/10.1109/INEC.2008.4585680

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title = "In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials",

abstract = "The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO2 and pure multi-walled BN nanotubes.",

author = "D. Golberg and Costa, {P. M.F.J.} and M. Mitome and Y. Bando",

year = "2008",

doi = "10.1109/INEC.2008.4585680",

language = "English (US)",

isbn = "9781424415731",

series = "2008 2nd IEEE International Nanoelectronics Conference, INEC 2008",

pages = "1127--1131",

booktitle = "2008 2nd IEEE International Nanoelectronics Conference, INEC 2008",

note = "2008 2nd IEEE International Nanoelectronics Conference, INEC 2008 ; Conference date: 24-03-2008 Through 27-03-2008",

}

Golberg, D, Costa, PMFJ, Mitome, M & Bando, Y 2008, In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials. in 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008., 4585680, 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008, pp. 1127-1131, 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008, Shanghai, China, 03/24/08. https://doi.org/10.1109/INEC.2008.4585680

In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials. / Golberg, D.; Costa, P. M.F.J.; Mitome, M. et al.
2008 2nd IEEE International Nanoelectronics Conference, INEC 2008. 2008. p. 1127-1131 4585680 (2008 2nd IEEE International Nanoelectronics Conference, INEC 2008).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Mitome, M.

AU - Bando, Y.

PY - 2008

Y1 - 2008

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AB - The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO2 and pure multi-walled BN nanotubes.

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T3 - 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008

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Y2 - 24 March 2008 through 27 March 2008

ER -

In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

Abstract

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Other

ASJC Scopus subject areas

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