In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

D. Golberg; P. M.F.J. Costa; M. Mitome; Y. Bando

doi:10.1109/INEC.2008.4585680

In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

D. Golberg^*, P. M.F.J. Costa, M. Mitome, Y. Bando

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO₂ and pure multi-walled BN nanotubes.

Original language	English (US)
Title of host publication	2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
Pages	1127-1131
Number of pages	5
DOIs	https://doi.org/10.1109/INEC.2008.4585680
State	Published - 2008
Externally published	Yes
Event	2008 2nd IEEE International Nanoelectronics Conference, INEC 2008 - Shanghai, China Duration: Mar 24 2008 → Mar 27 2008

Other

Other	2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
Country/Territory	China
City	Shanghai
Period	03/24/08 → 03/27/08

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/INEC.2008.4585680

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title = "In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials",

abstract = "The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO2 and pure multi-walled BN nanotubes.",

author = "D. Golberg and Costa, {P. M.F.J.} and M. Mitome and Y. Bando",

year = "2008",

doi = "10.1109/INEC.2008.4585680",

language = "English (US)",

isbn = "9781424415731",

pages = "1127--1131",

booktitle = "2008 2nd IEEE International Nanoelectronics Conference, INEC 2008",

note = "2008 2nd IEEE International Nanoelectronics Conference, INEC 2008 ; Conference date: 24-03-2008 Through 27-03-2008",

}

Golberg, D, Costa, PMFJ, Mitome, M & Bando, Y 2008, In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials. in 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008., 4585680, pp. 1127-1131, 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008, Shanghai, China, 03/24/08. https://doi.org/10.1109/INEC.2008.4585680

TY - GEN

T1 - In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

AU - Golberg, D.

AU - Costa, P. M.F.J.

AU - Mitome, M.

AU - Bando, Y.

PY - 2008

Y1 - 2008

N2 - The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO2 and pure multi-walled BN nanotubes.

AB - The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO2 and pure multi-walled BN nanotubes.

UR - http://www.scopus.com/inward/record.url?scp=52649106026&partnerID=8YFLogxK

U2 - 10.1109/INEC.2008.4585680

DO - 10.1109/INEC.2008.4585680

M3 - Conference contribution

AN - SCOPUS:52649106026

SN - 9781424415731

SP - 1127

EP - 1131

BT - 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008

T2 - 2008 2nd IEEE International Nanoelectronics Conference, INEC 2008

Y2 - 24 March 2008 through 27 March 2008

ER -

In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

Abstract

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