Abstract
Understanding the properties regarding the high-index surfaces of the oxide nanocrystals is of great importance, but it remains challenging to obtain atomic-level information due to the lack of efficient preparation methods for high-index surfaces. Herein, we presented a work to in situ prepare and determine the intrinsic atomic structures of nanocrystalline CeO2 high-index surfaces via in situ spherical aberration (Cs)-corrected scanning transmission electron microscopy (STEM). By utilizing a reshaping process driven by the Wulff reconstruction, high-index surfaces of CeO2 nanocrystals including {210} {311}, and {533} were successfully prepared. Combined STEM with the density functional theory calculations, these high-index surface structures were determined with atomic precision, and interestingly {533} exhibited a unique atomic pit feature with low-coordinated Ce atoms exposure and unique electrical properties. This work has revealed new information about CeO2 high-index surfaces through experiments, enhancing our understanding of these surfaces, and also providing a new route for preparing high-index surfaces.
Original language | English (US) |
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Pages (from-to) | 100411 |
Journal | Materials Today Nano |
Volume | 24 |
DOIs | |
State | Published - Sep 27 2023 |
Bibliographical note
KAUST Repository Item: Exported on 2023-10-04Acknowledgements: We acknowledge the financial support of the National Key Research and Development Program of China (2022YFA1505500), the National Natural Science Foundation of China (51971202, 52025011, 92045301, and 52171019), the Key Research and Development Program of Zhejiang Province (2021C01003), the Zhejiang Provincial Natural Science Foundation of China (LR23B030004, LD19B030001), Shanxi-Zheda Institute of Advanced Materials and Chemical Engineering and the Fundamental Research Funds for the Central Universities.