In Situ Observation of Low-Power Nano-Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy

Fei Hui; Peisong Liu; Stephen A. Hodge; Tian Carey; Chao Wen; Felice Torrisi; D. Thanuja L. Galhena; Flavia Tomarchio; Yue Lin; Enrique Moreno; Juan B. Roldan; Elad Koren; Andrea C. Ferrari; Mario Lanza

doi:10.1002/smll.202101100

In Situ Observation of Low-Power Nano-Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy

Fei Hui, Peisong Liu, Stephen A. Hodge, Tian Carey, Chao Wen, Felice Torrisi, D. Thanuja L. Galhena, Flavia Tomarchio, Yue Lin, Enrique Moreno, Juan B. Roldan, Elad Koren, Andrea C. Ferrari, Mario Lanza

Physical Sciences and Engineering

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

Multiple studies have reported the observation of electro-synaptic response in different metal/insulator/metal devices. However, most of them analyzed large (>1 µm2 ) devices that do not meet the integration density required by industry (1010 devices/mm2 ). Some studies emploied a scanning tunneling microscope (STM) to explore nano-synaptic response in different materials, but in this setup there is a nanogap between the insulator and one of the metallic electrodes (i.e., the STM tip), not present in real devices. Here, it is demonstrated how to use conductive atomic force microscopy to explore the presence and quality of nano-synaptic response in confined areas

Original language	English (US)
Pages (from-to)	2101100
Journal	Small
DOIs	https://doi.org/10.1002/smll.202101100
State	Published - Jun 3 2021

Bibliographical note

KAUST Repository Item: Exported on 2021-06-07
Acknowledgements: The authors acknowledge funding by the Ministry of Science and Technology of China (grant no. 2018YFE0100800, 2019YFE0124200), the National Natural Science Foundation of China (grant no. 61874075), the Ministry of Finance of China (grant no. SX21400213), the Jiangsu Planned Projects for Postdoctoral Research Funds of China (grant No. 7131712019), the 111 Project from the State Administration of Foreign Experts Affairs of China, the Collaborative Innovation Centre of Suzhou Nano Science & Technology, the Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, the Priority Academic Program Development of Jiangsu Higher Education Institutions, the Isaac Newton Trust, the EU project CareRAMM, EU Graphene Flagship, ERC grants Hetero2D and MINERGRACE, EPSRC grants EP/K01711X/1, EP/K017144/1, EP/N010345/1, EP/M507799/1, EP/L016087/1, EP/R511547/1, EP/P02534X/2, EP/T005106/1, and a Technion-Guangdong Fellowship.

ASJC Scopus subject areas

General Medicine

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10.1002/smll.202101100

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@article{a46105f0e1fe4b36b554f42adda65b74,

title = "In Situ Observation of Low-Power Nano-Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy",

abstract = "Multiple studies have reported the observation of electro-synaptic response in different metal/insulator/metal devices. However, most of them analyzed large (>1 µm2 ) devices that do not meet the integration density required by industry (1010 devices/mm2 ). Some studies emploied a scanning tunneling microscope (STM) to explore nano-synaptic response in different materials, but in this setup there is a nanogap between the insulator and one of the metallic electrodes (i.e., the STM tip), not present in real devices. Here, it is demonstrated how to use conductive atomic force microscopy to explore the presence and quality of nano-synaptic response in confined areas",

author = "Fei Hui and Peisong Liu and Hodge, {Stephen A.} and Tian Carey and Chao Wen and Felice Torrisi and Galhena, {D. Thanuja L.} and Flavia Tomarchio and Yue Lin and Enrique Moreno and Roldan, {Juan B.} and Elad Koren and Ferrari, {Andrea C.} and Mario Lanza",

note = "KAUST Repository Item: Exported on 2021-06-07 Acknowledgements: The authors acknowledge funding by the Ministry of Science and Technology of China (grant no. 2018YFE0100800, 2019YFE0124200), the National Natural Science Foundation of China (grant no. 61874075), the Ministry of Finance of China (grant no. SX21400213), the Jiangsu Planned Projects for Postdoctoral Research Funds of China (grant No. 7131712019), the 111 Project from the State Administration of Foreign Experts Affairs of China, the Collaborative Innovation Centre of Suzhou Nano Science & Technology, the Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, the Priority Academic Program Development of Jiangsu Higher Education Institutions, the Isaac Newton Trust, the EU project CareRAMM, EU Graphene Flagship, ERC grants Hetero2D and MINERGRACE, EPSRC grants EP/K01711X/1, EP/K017144/1, EP/N010345/1, EP/M507799/1, EP/L016087/1, EP/R511547/1, EP/P02534X/2, EP/T005106/1, and a Technion-Guangdong Fellowship.",

year = "2021",

month = jun,

day = "3",

doi = "10.1002/smll.202101100",

language = "English (US)",

pages = "2101100",

journal = "Small",

issn = "1613-6810",

publisher = "Wiley",

}

TY - JOUR

T1 - In Situ Observation of Low-Power Nano-Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy

AU - Hui, Fei

AU - Liu, Peisong

AU - Hodge, Stephen A.

AU - Carey, Tian

AU - Wen, Chao

AU - Torrisi, Felice

AU - Galhena, D. Thanuja L.

AU - Tomarchio, Flavia

AU - Lin, Yue

AU - Moreno, Enrique

AU - Roldan, Juan B.

AU - Koren, Elad

AU - Ferrari, Andrea C.

AU - Lanza, Mario

N1 - KAUST Repository Item: Exported on 2021-06-07 Acknowledgements: The authors acknowledge funding by the Ministry of Science and Technology of China (grant no. 2018YFE0100800, 2019YFE0124200), the National Natural Science Foundation of China (grant no. 61874075), the Ministry of Finance of China (grant no. SX21400213), the Jiangsu Planned Projects for Postdoctoral Research Funds of China (grant No. 7131712019), the 111 Project from the State Administration of Foreign Experts Affairs of China, the Collaborative Innovation Centre of Suzhou Nano Science & Technology, the Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, the Priority Academic Program Development of Jiangsu Higher Education Institutions, the Isaac Newton Trust, the EU project CareRAMM, EU Graphene Flagship, ERC grants Hetero2D and MINERGRACE, EPSRC grants EP/K01711X/1, EP/K017144/1, EP/N010345/1, EP/M507799/1, EP/L016087/1, EP/R511547/1, EP/P02534X/2, EP/T005106/1, and a Technion-Guangdong Fellowship.

PY - 2021/6/3

Y1 - 2021/6/3

N2 - Multiple studies have reported the observation of electro-synaptic response in different metal/insulator/metal devices. However, most of them analyzed large (>1 µm2 ) devices that do not meet the integration density required by industry (1010 devices/mm2 ). Some studies emploied a scanning tunneling microscope (STM) to explore nano-synaptic response in different materials, but in this setup there is a nanogap between the insulator and one of the metallic electrodes (i.e., the STM tip), not present in real devices. Here, it is demonstrated how to use conductive atomic force microscopy to explore the presence and quality of nano-synaptic response in confined areas

AB - Multiple studies have reported the observation of electro-synaptic response in different metal/insulator/metal devices. However, most of them analyzed large (>1 µm2 ) devices that do not meet the integration density required by industry (1010 devices/mm2 ). Some studies emploied a scanning tunneling microscope (STM) to explore nano-synaptic response in different materials, but in this setup there is a nanogap between the insulator and one of the metallic electrodes (i.e., the STM tip), not present in real devices. Here, it is demonstrated how to use conductive atomic force microscopy to explore the presence and quality of nano-synaptic response in confined areas

UR - http://hdl.handle.net/10754/669400

UR - https://onlinelibrary.wiley.com/doi/10.1002/smll.202101100

U2 - 10.1002/smll.202101100

DO - 10.1002/smll.202101100

M3 - Article

C2 - 34081416

SN - 1613-6810

SP - 2101100

JO - Small

JF - Small

ER -

In Situ Observation of Low-Power Nano-Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy

Abstract

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