In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories

Yuanyuan Shi, Yanfeng Ji, Fei Hui, Montserrat Nafria, Marc Porti, Gennadi Bersuker, Mario Lanza

Research output: Contribution to journalArticlepeer-review

12 Scopus citations
Original languageEnglish (US)
JournalAdvanced Electronic Materials
Issue number4
StatePublished - Apr 1 2015
Externally publishedYes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2021-03-16

Cite this