Original language | English (US) |
---|---|
Journal | Advanced Electronic Materials |
Volume | 1 |
Issue number | 4 |
DOIs | |
State | Published - Apr 1 2015 |
Externally published | Yes |
In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories
Yuanyuan Shi, Yanfeng Ji, Fei Hui, Montserrat Nafria, Marc Porti, Gennadi Bersuker, Mario Lanza
Research output: Contribution to journal › Article › peer-review
13
Scopus
citations