Improving the electrical performance of a conductive atomic force microscope with a logarithmic current-to-voltage converter

Keyphrases

• Electrical Performance 100%
• Conductive Atomic Force Microscopy (C-AFM) 100%
• Voltage-to-current Converter 100%
• Dynamic Range 50%
• Current Dynamics 50%
• Gate Dielectric 25%
• Metal Oxide Semiconductor 25%
• New Configuration 25%
• Reliability Evaluation 25%
• V-I Converter 25%

Engineering

• Conductive 100%
• Atomic Force Microscope 100%
• Electrical Performance 100%
• Dynamic Range 50%
• Metal Oxide Semiconductor 25%
• Gate Dielectric 25%
• Amplifier 25%
• Broadening 25%
• Reliability Evaluation 25%

Physics

• Dynamic Range 100%
• Dielectrics 50%
• Metal Oxide Semiconductor 50%