Improving grain yield, stress resilience and quality of bread wheat using large-scale genomics

Philomin Juliana, Jesse Poland, Julio Huerta-Espino, Sandesh Shrestha, José Crossa, Leonardo Crespo-Herrera, Fernando Henrique Toledo, Velu Govindan, Suchismita Mondal, Uttam Kumar, Sridhar Bhavani, Pawan K. Singh, Mandeep S. Randhawa, Xinyao He, Carlos Guzman, Susanne Dreisigacker, Matthew N. Rouse, Yue Jin, Paulino Pérez-Rodríguez, Osval A. Montesinos-LópezDaljit Singh, Mohammad Mokhlesur Rahman, Felix Marza, Ravi Prakash Singh

Research output: Contribution to journalArticlepeer-review

107 Scopus citations

Abstract

Bread wheat improvement using genomic tools is essential for accelerating trait genetic gains. Here we report the genomic predictabilities of 35 key traits and demonstrate the potential of genomic selection for wheat end-use quality. We also performed a large genome-wide association study that identified several significant marker–trait associations for 50 traits evaluated in South Asia, Africa and the Americas. Furthermore, we built a reference wheat genotype–phenotype map, explored allele frequency dynamics over time and fingerprinted 44,624 wheat lines for trait-associated markers, generating over 7.6 million data points, which together will provide a valuable resource to the wheat community for enhancing productivity and stress resilience.
Original languageEnglish (US)
Pages (from-to)1530-1539
Number of pages10
JournalNature Genetics
Volume51
Issue number10
DOIs
StatePublished - Oct 1 2019
Externally publishedYes

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