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Improved interface characterization technique for high-k/metal gated MugFETs utilizing a gated diode structure
C. D. Young, A. Neugroschel, K. Matthews, Casey Smith, H. Park, M. M. Hussain, P. Majhi, G. Bersuker
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
6
Scopus
citations