An integrated synchronous buck converter, designed in a 0.18-m high-voltage CMOS technology, is analyzed to investigate the impact of the dead times between the control signals on the radiated emissions. The designed converter enables to set the dead times of the control signals for both integrated or off-chip transistor switches. The test boards are designed to analyze the impact of dead times on radiated emissions for integrated and discrete synchronous buck converter. The radiated emissions of both integrated and discrete converter are measured in a semi-anechoic chamber.
|Original language||English (US)|
|Title of host publication||EMC COMPO 2019 - 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||3|
|State||Published - Oct 1 2019|