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Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon
M. Zenari, M. Buffolo, C. De Santi, C. Shang, E. Hughes, Y. Wan, R. W. Herrick, G. Meneghesso, E. Zanoni, J. Bowers, M. Meneghini
Research output: Contribution to journal › Article › peer-review
6
Scopus
citations