Abstract
The photodetector is fabricated simply by spray-coating ZnO QDs on a CuO micro-pyramid array. The p-n junction structure enhances the performance of the DUV n-ZnO/p-CuO/p-Si micro-pyramid device. The photodetector is characterized by high photo-responsivity at 244 nm (UV-C) with fast photoresponse and a cut-off at 280 nm. High self-powered photoresponse is confirmed. These high-performance solar-bind DUV photodetector arrays can be scaled up for mass production of a wide range of applications.
Original language | English (US) |
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Title of host publication | 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 185-187 |
Number of pages | 3 |
ISBN (Electronic) | 9781665421775 |
DOIs | |
State | Published - 2022 |
Event | 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022 - Virtual, Online, Japan Duration: Mar 6 2022 → Mar 9 2022 |
Publication series
Name | 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022 |
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Conference
Conference | 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022 |
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Country/Territory | Japan |
City | Virtual, Online |
Period | 03/6/22 → 03/9/22 |
Bibliographical note
Publisher Copyright:© 2022 IEEE.
Keywords
- deep UV
- nanoparticles-based devices
- photodiode
ASJC Scopus subject areas
- Process Chemistry and Technology
- Hardware and Architecture
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Electronic, Optical and Magnetic Materials