High mobility and low density of trap states in dual-solid-gated PbS nanocrystal field-effect transistors

Mohamad Insan Nugraha, Roger Häusermann, Satria Zulkarnaen Bisri, Hiroyuki Matsui, Mykhailo Sytnyk, Wolfgang Heiss, Jun Takeya*, Maria Antonietta Loi

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    59 Scopus citations

    Abstract

    Dual-gated PbS nanocrystal field-effect transistors employing SiO2 and Cytop as gate dielectrics are fabricated. The obtained electron mobility (0.2 cm2 V-1 s-1) and the high on/off ratio (105-106), show that the controlled nanocrystal assembly (obtained with self-assembled monolayers), as well as the trap density reduction (using Cytop as dielectric), are crucial steps for the future application of nanocrystals.

    Original languageEnglish (US)
    Pages (from-to)2107-2112
    Number of pages6
    JournalAdvanced Materials
    Volume27
    Issue number12
    DOIs
    StatePublished - Mar 25 2015

    Bibliographical note

    Publisher Copyright:
    © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

    Keywords

    • ambipolar transistors
    • colloidal nanocrystals
    • density of trap states
    • field effect transistors

    ASJC Scopus subject areas

    • General Materials Science
    • Mechanics of Materials
    • Mechanical Engineering

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