Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M. Lanza, A. Bayerl, T. Gao, M. Porti, M. Nafria, G. Y. Jing, Y. F. Zhang, Z. F. Liu, H. L. Duan

Research output: Contribution to journal › Article › peer-review

59 Scopus citations

Fingerprint

Dive into the research topics of 'Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization'. Together they form a unique fingerprint.

Engineering

Material Science

Keyphrases