Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M. Lanza; A. Bayerl; T. Gao; M. Porti; M. Nafria; G. Y. Jing; Y. F. Zhang; Z. F. Liu; H. L. Duan

doi:10.1002/adma.201204380

Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M. Lanza, A. Bayerl, T. Gao, M. Porti, M. Nafria, G. Y. Jing, Y. F. Zhang, Z. F. Liu, H. L. Duan

Research output: Contribution to journal › Article › peer-review

58 Scopus citations

Abstract

Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Original language	English (US)
Pages (from-to)	1440-1444
Number of pages	5
Journal	Advanced Materials
Volume	25
Issue number	10
DOIs	https://doi.org/10.1002/adma.201204380
State	Published - Mar 13 2013
Externally published	Yes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2021-03-16

ASJC Scopus subject areas

Mechanics of Materials
General Materials Science
Mechanical Engineering

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title = "Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization",

abstract = "Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. {\textcopyright} 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.",

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doi = "10.1002/adma.201204380",

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T1 - Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

AU - Lanza, M.

AU - Bayerl, A.

AU - Gao, T.

AU - Porti, M.

AU - Nafria, M.

AU - Jing, G. Y.

AU - Zhang, Y. F.

AU - Liu, Z. F.

AU - Duan, H. L.

N1 - Generated from Scopus record by KAUST IRTS on 2021-03-16

PY - 2013/3/13

Y1 - 2013/3/13

N2 - Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

AB - Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

UR - http://doi.wiley.com/10.1002/adma.201204380

UR - http://www.scopus.com/inward/record.url?scp=84874963664&partnerID=8YFLogxK

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DO - 10.1002/adma.201204380

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VL - 25

SP - 1440

EP - 1444

JO - Advanced Materials

JF - Advanced Materials

IS - 10

ER -

Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

Abstract

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ASJC Scopus subject areas

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