Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield.

Philomin Juliana, Xinyao He, Sandesh Shrestha, Arun K Joshi, Julio Huerta-Espino, Velu Govindan, Leonardo Abdiel Crespo-Herrera, Suchismita Mondal, Uttam Kumar, Pradeep K Bhati, Manish Vishwakarma, Ravi P Singh, Pawan K Singh

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

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Agricultural and Biological Sciences

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