From Imaging Conductivity to Imaging Electron Density

Ondrej Dyck; Jawaher Almutlaq; David Lingerfelt; Jacob L. Swett; Bevin Huang; Andrew R. Lupini; Dirk Englund; Stephen Jesse

doi:10.1093/mam/ozae044.065

From Imaging Conductivity to Imaging Electron Density

Ondrej Dyck, Jawaher Almutlaq, David Lingerfelt, Jacob L. Swett, Bevin Huang, Andrew R. Lupini, Dirk Englund, Stephen Jesse

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Original language	English (US)
Pages	138-139
Number of pages	2
DOIs	https://doi.org/10.1093/mam/ozae044.065
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

Conference

Conference	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024
Country/Territory	United States
City	Cleveland
Period	07/28/24 → 08/1/24

ASJC Scopus subject areas

Instrumentation

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10.1093/mam/ozae044.065

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Dyck, O., Almutlaq, J., Lingerfelt, D., Swett, J. L., Huang, B., Lupini, A. R., Englund, D., & Jesse, S. (2024). From Imaging Conductivity to Imaging Electron Density. 138-139. Paper presented at 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024, Cleveland, United States. https://doi.org/10.1093/mam/ozae044.065

@conference{55d9c04ffdf841b18e8bcec555b840b3,

title = "From Imaging Conductivity to Imaging Electron Density",

author = "Ondrej Dyck and Jawaher Almutlaq and David Lingerfelt and Swett, \{Jacob L.\} and Bevin Huang and Lupini, \{Andrew R.\} and Dirk Englund and Stephen Jesse",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.065",

language = "English (US)",

pages = "138--139",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

}

Dyck, O, Almutlaq, J, Lingerfelt, D, Swett, JL, Huang, B, Lupini, AR, Englund, D & Jesse, S 2024, 'From Imaging Conductivity to Imaging Electron Density', Paper presented at 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024, Cleveland, United States, 07/28/24 - 08/1/24 pp. 138-139. https://doi.org/10.1093/mam/ozae044.065

TY - CONF

T1 - From Imaging Conductivity to Imaging Electron Density

AU - Dyck, Ondrej

AU - Almutlaq, Jawaher

AU - Lingerfelt, David

AU - Swett, Jacob L.

AU - Huang, Bevin

AU - Lupini, Andrew R.

AU - Englund, Dirk

AU - Jesse, Stephen

PY - 2024/7/24

Y1 - 2024/7/24

UR - http://www.scopus.com/inward/record.url?scp=85215692010&partnerID=8YFLogxK

U2 - 10.1093/mam/ozae044.065

DO - 10.1093/mam/ozae044.065

M3 - Paper

AN - SCOPUS:85215692010

SP - 138

EP - 139

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

From Imaging Conductivity to Imaging Electron Density

Conference

ASJC Scopus subject areas

Access to Document

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