Flexible Metal-Organic Framework for Mechanical Sub Tbyte inch−2 Data Recording under Ambient Condition

P. V. Alekseevskiy; S. Rzhevskiy; V. Gilemkhanova; N. K. Kulachenkov; Aleksandr Sapianik; Marina Barsukova; V. P. Fedin; V. A. Milichko

doi:10.1002/admi.202101196

Flexible Metal-Organic Framework for Mechanical Sub Tbyte inch−2 Data Recording under Ambient Condition

P. V. Alekseevskiy, S. Rzhevskiy, V. Gilemkhanova, N. K. Kulachenkov, Aleksandr Sapianik, Marina Barsukova, V. P. Fedin, V. A. Milichko

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Metal-organic frameworks (MOFs), demonstrating structural response on external stimuli, represent a promising family of crystalline materials for microelectronic and data storage devices. Herein, manipulation with MOF structure at the nanometer scale for the device miniaturization is still a challenge. Here, mechanical recording and reading the nanometer scale patterns onto flexible 2D MOF at ambient conditions are reported. Treatment of the MOF surface with a hot solvent decreases the roughness up to 1/7 of the layer thickness. Therefore, an atomic force microscope probe is allowed to cause the deformations with the spatial resolution up to 25 nm (≈0.1 Tbyte inch−2 storage density) and the depth from 0.4 nm. Selective chemical etching by the solvent can further develop the pattern, while the integrity of the MOF structure maintains. The realization of the "read-only-memory" concept on flexible MOF at ambient conditions paves the way for next-generation sustainable data storage materials.

Original language	English (US)
Journal	Advanced Materials Interfaces
DOIs	https://doi.org/10.1002/admi.202101196
State	Published - Jan 1 2021

Bibliographical note

KAUST Repository Item: Exported on 2021-10-29
Acknowledgements: The authors thank I. Pustovit for the design in Figure 2b and Innovative Solutions Bulgaria Ltd, for producing MikroMasch AFM probes and for providing SEM micrographs in Figure S2 , Supporting Information. V.A.M. acknowledges financial support from the Russian Science Foundation (Project No. 19-79-10241) for AFM experiments.

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering

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10.1002/admi.202101196

https://repository.kaust.edu.sa/bitstream/10754/672987/1/Flexible%20matter_admi.202101196-6.pdf

Cite this

@article{fa9ced5bf77548d6b032fadfaa603b33,

title = "Flexible Metal-Organic Framework for Mechanical Sub Tbyte inch−2 Data Recording under Ambient Condition",

abstract = "Metal-organic frameworks (MOFs), demonstrating structural response on external stimuli, represent a promising family of crystalline materials for microelectronic and data storage devices. Herein, manipulation with MOF structure at the nanometer scale for the device miniaturization is still a challenge. Here, mechanical recording and reading the nanometer scale patterns onto flexible 2D MOF at ambient conditions are reported. Treatment of the MOF surface with a hot solvent decreases the roughness up to 1/7 of the layer thickness. Therefore, an atomic force microscope probe is allowed to cause the deformations with the spatial resolution up to 25 nm (≈0.1 Tbyte inch−2 storage density) and the depth from 0.4 nm. Selective chemical etching by the solvent can further develop the pattern, while the integrity of the MOF structure maintains. The realization of the {"}read-only-memory{"} concept on flexible MOF at ambient conditions paves the way for next-generation sustainable data storage materials.",

author = "Alekseevskiy, {P. V.} and S. Rzhevskiy and V. Gilemkhanova and Kulachenkov, {N. K.} and Aleksandr Sapianik and Marina Barsukova and Fedin, {V. P.} and Milichko, {V. A.}",

note = "KAUST Repository Item: Exported on 2021-10-29 Acknowledgements: The authors thank I. Pustovit for the design in Figure 2b and Innovative Solutions Bulgaria Ltd, for producing MikroMasch AFM probes and for providing SEM micrographs in Figure S2 , Supporting Information. V.A.M. acknowledges financial support from the Russian Science Foundation (Project No. 19-79-10241) for AFM experiments.",

year = "2021",

month = jan,

day = "1",

doi = "10.1002/admi.202101196",

language = "English (US)",

journal = "Advanced Materials Interfaces",

issn = "2196-7350",

publisher = "John Wiley and Sons Ltd",

}

TY - JOUR

T1 - Flexible Metal-Organic Framework for Mechanical Sub Tbyte inch−2 Data Recording under Ambient Condition

AU - Alekseevskiy, P. V.

AU - Rzhevskiy, S.

AU - Gilemkhanova, V.

AU - Kulachenkov, N. K.

AU - Sapianik, Aleksandr

AU - Barsukova, Marina

AU - Fedin, V. P.

AU - Milichko, V. A.

N1 - KAUST Repository Item: Exported on 2021-10-29 Acknowledgements: The authors thank I. Pustovit for the design in Figure 2b and Innovative Solutions Bulgaria Ltd, for producing MikroMasch AFM probes and for providing SEM micrographs in Figure S2 , Supporting Information. V.A.M. acknowledges financial support from the Russian Science Foundation (Project No. 19-79-10241) for AFM experiments.

PY - 2021/1/1

Y1 - 2021/1/1

N2 - Metal-organic frameworks (MOFs), demonstrating structural response on external stimuli, represent a promising family of crystalline materials for microelectronic and data storage devices. Herein, manipulation with MOF structure at the nanometer scale for the device miniaturization is still a challenge. Here, mechanical recording and reading the nanometer scale patterns onto flexible 2D MOF at ambient conditions are reported. Treatment of the MOF surface with a hot solvent decreases the roughness up to 1/7 of the layer thickness. Therefore, an atomic force microscope probe is allowed to cause the deformations with the spatial resolution up to 25 nm (≈0.1 Tbyte inch−2 storage density) and the depth from 0.4 nm. Selective chemical etching by the solvent can further develop the pattern, while the integrity of the MOF structure maintains. The realization of the "read-only-memory" concept on flexible MOF at ambient conditions paves the way for next-generation sustainable data storage materials.

AB - Metal-organic frameworks (MOFs), demonstrating structural response on external stimuli, represent a promising family of crystalline materials for microelectronic and data storage devices. Herein, manipulation with MOF structure at the nanometer scale for the device miniaturization is still a challenge. Here, mechanical recording and reading the nanometer scale patterns onto flexible 2D MOF at ambient conditions are reported. Treatment of the MOF surface with a hot solvent decreases the roughness up to 1/7 of the layer thickness. Therefore, an atomic force microscope probe is allowed to cause the deformations with the spatial resolution up to 25 nm (≈0.1 Tbyte inch−2 storage density) and the depth from 0.4 nm. Selective chemical etching by the solvent can further develop the pattern, while the integrity of the MOF structure maintains. The realization of the "read-only-memory" concept on flexible MOF at ambient conditions paves the way for next-generation sustainable data storage materials.

UR - http://hdl.handle.net/10754/672987

UR - https://onlinelibrary.wiley.com/doi/10.1002/admi.202101196

UR - http://www.scopus.com/inward/record.url?scp=85117527685&partnerID=8YFLogxK

U2 - 10.1002/admi.202101196

DO - 10.1002/admi.202101196

M3 - Article

SN - 2196-7350

JO - Advanced Materials Interfaces

JF - Advanced Materials Interfaces

ER -

Flexible Metal-Organic Framework for Mechanical Sub Tbyte inch−2 Data Recording under Ambient Condition

Abstract

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