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Dive into the research topics of 'Far infrared near normal specular reflectivity of Nix(SiO2)1-x (x = 1.0, 0.84, 0.75, 0.61, 0.54, 0.28) granular films'. Together they form a unique fingerprint.- Sort by
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Néstor E. Massa, Juliano C. Denardin, Leandro M. Socolovsky, Marcelo Knobel, Fernando Pablo De La Cruz, Xixiang Zhang
Research output: Contribution to journal › Article › peer-review