TY - JOUR
T1 - Failures induced on bipolar operational amplifiers from electromagnetic interferences conducted on the power supply rails
AU - Speciale, N.
AU - Setti, G.
N1 - Generated from Scopus record by KAUST IRTS on 2023-02-15
PY - 1999/1/1
Y1 - 1999/1/1
N2 - In this work we will study the effects of electromagnetic interferences conveyed to the supply rails of integrated bipolar operational amplifiers. In particular, with reference to the well known μA741 topology, we will show that amplifiers undergo very strong failures when subjected to EMI conveyed to the negative supply, while they are only moderately sensible to interferences conveyed to the positive supply. Finally, on the basis of detailed circuit analyses and simulations, we will report the physical origin of such failures.
AB - In this work we will study the effects of electromagnetic interferences conveyed to the supply rails of integrated bipolar operational amplifiers. In particular, with reference to the well known μA741 topology, we will show that amplifiers undergo very strong failures when subjected to EMI conveyed to the negative supply, while they are only moderately sensible to interferences conveyed to the positive supply. Finally, on the basis of detailed circuit analyses and simulations, we will report the physical origin of such failures.
UR - http://www.scopus.com/inward/record.url?scp=0032655292&partnerID=8YFLogxK
M3 - Article
SN - 0099-9512
SP - 333
EP - 336
JO - Annual Proceedings - Reliability Physics (Symposium)
JF - Annual Proceedings - Reliability Physics (Symposium)
ER -