Fabrication of tuning-fork based AFM and STM tungsten probe

Hisham Al-Falih; Yasser Khan; Yaping Zhang; Damian San Roman Alerigi; Dong Kyu Cha; Boon S. Ooi; Tien Khee Ng

doi:10.1109/HONET.2011.6149815

Fabrication of tuning-fork based AFM and STM tungsten probe

Hisham Al-Falih, Yasser Khan, Yaping Zhang, Damian San Roman Alerigi, Dong Kyu Cha, Boon S. Ooi, Tien Khee Ng

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.

Original language	English (US)
Title of host publication	8th International Conference on High-capacity Optical Networks and Emerging Technologies
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	190-192
Number of pages	3
ISBN (Print)	9781457711695
DOIs	https://doi.org/10.1109/HONET.2011.6149815
State	Published - Dec 2011

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01

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10.1109/HONET.2011.6149815

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Al-Falih, H., Khan, Y., Zhang, Y., San Roman Alerigi, D., Cha, D. K., Ooi, B. S., & Ng, T. K. (2011). Fabrication of tuning-fork based AFM and STM tungsten probe. In 8th International Conference on High-capacity Optical Networks and Emerging Technologies (pp. 190-192). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/HONET.2011.6149815

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author = "Hisham Al-Falih and Yasser Khan and Yaping Zhang and {San Roman Alerigi}, Damian and Cha, {Dong Kyu} and Ooi, {Boon S.} and Ng, {Tien Khee}",

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Fabrication of tuning-fork based AFM and STM tungsten probe. / Al-Falih, Hisham; Khan, Yasser; Zhang, Yaping et al.
8th International Conference on High-capacity Optical Networks and Emerging Technologies. Institute of Electrical and Electronics Engineers (IEEE), 2011. p. 190-192.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Fabrication of tuning-fork based AFM and STM tungsten probe

AU - Al-Falih, Hisham

AU - Khan, Yasser

AU - Zhang, Yaping

AU - San Roman Alerigi, Damian

AU - Cha, Dong Kyu

AU - Ooi, Boon S.

AU - Ng, Tien Khee

N1 - KAUST Repository Item: Exported on 2020-10-01

PY - 2011/12

Y1 - 2011/12

N2 - We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.

AB - We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.

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DO - 10.1109/HONET.2011.6149815

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EP - 192

BT - 8th International Conference on High-capacity Optical Networks and Emerging Technologies

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -

Fabrication of tuning-fork based AFM and STM tungsten probe

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