Extending device noise measurement capacity for OFDM-based PLC systems: Design, implementation, and on-field validation

Aymen Omri*, Javier Hernandez Fernandez, Roberto Di Pietro

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Extending device noise measurement capacity for OFDM-based PLC systems: Design, implementation, and on-field validation'. Together they form a unique fingerprint.

Engineering

Computer Science

Keyphrases

Chemical Engineering